NI PXIE-5673E 矢量信号发生器
1.产 品 资 料 介 绍:
中文资料:
NI PXIe-5673E 是国家仪器(NI)推出的一款高性能矢量信号发生器,适用于自动化测试与测量,特别在无线通信和射频(RF)领域有广泛应用。
主要特点:
频率范围:
- 支持 50 MHz 到 6.6 GHz 的频率范围,能够覆盖广泛的无线通信频段。
高带宽性能:
- 提供高达 100 MHz 的瞬时带宽,能够满足高频宽信号生成需求,适用于高速数据通信测试。
多通道同步:
- 支持多达 4 个同步通道,能够在同一设备上实现多通道的信号生成,适用于 MIMO (多输入多输出) 和波束成形等技术测试。
灵活的 RF 列表模式:
- 提供 RF 列表模式,支持快速、确定性的信号配置更改,从而提升测试效率,特别适用于信号的快速切换与测试。
高精度:
- 具备高精度的信号输出,能够生成稳定且低失真的信号,确保测试结果的可靠性。
应用领域:
- 无线通信: 用于测试无线设备和系统,特别是在5G、LTE、Wi-Fi等通信技术的验证过程中应用广泛。
- 射频(RF)测试: 用于射频元器件、系统和模块的验证。
- 半导体测试: 适用于半导体设备的射频性能测试,确保器件在特定频率范围内的工作稳定性。
- 科研与教育: 作为科研实验和教育实验中的信号生成工具,广泛应用于电气工程与通信技术的实验教学。
维护与支持:
- NI 提供全面的技术支持和设备校准服务,确保 PXIe-5673E 长期稳定运行。对于设备出现的任何问题,NI 也提供专业的故障排除和维修服务。
英文资料:
NI PXIe-5673E is a high-performance vector signal generator launched by National Instruments (NI), suitable for automated testing and measurement, particularly in the fields of wireless communication and radio frequency (RF).
Main features:
Frequency range:
Supports a frequency range of 50 MHz to 6.6 GHz, capable of covering a wide range of wireless communication frequency bands.
High bandwidth performance:
Providing an instantaneous bandwidth of up to 100 MHz, it can meet the requirements of high bandwidth signal generation and is suitable for high-speed data communication testing.
Multi channel synchronization:
Supports up to 4 synchronous channels, enabling multi-channel signal generation on the same device, suitable for MIMO (Multiple Input Multiple Output) and beamforming technology testing.
Flexible RF List Mode:
Provide RF list mode, support fast and deterministic signal configuration changes, thereby improving testing efficiency, especially suitable for fast signal switching and testing.
high-precision:
Equipped with high-precision signal output, capable of generating stable and low distortion signals, ensuring the reliability of test results.
Application areas:
Wireless communication: widely used for testing wireless devices and systems, especially in the verification process of communication technologies such as 5G, LTE, Wi Fi, etc.
Radio frequency (RF) testing: used for verifying RF components, systems, and modules.
Semiconductor testing: Suitable for RF performance testing of semiconductor equipment to ensure the stability of the device within a specific frequency range.
Research and Education: As a signal generation tool in scientific and educational experiments, it is widely used in experimental teaching of electrical engineering and communication technology.
Maintenance and Support:
NI provides comprehensive technical support and equipment calibration services to ensure the long-term stable operation of PXIe-5673E. NI also provides professional troubleshooting and repair services for any issues that may arise with the equipment.
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